| ISBN: ISBN: 0-7803-6546-1
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| ISBN: ISSN: 1089-3539
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| ISBN: DOI: 10.1109/TEST.2000.894259
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| |
| description |
The term functional BIST describes a test method to control
functional modules so that they generate a deterministic test set,
which targets structural faults within other parts of the system. It
is a promising solution for self-testing complex digital systems at
reduced costs in terms of area overhead and performance degradation.
While previous work mainly investigated the use of functional
modules for generating pseudo-random and pseudo-exhaustive test
patterns, the present paper shows that a variety of modules can also
be used as a deterministic test pattern generator via an appropriate
reseeding strategy. This method enables a BIST technique that does
not introduce additional hardware like test points and test
registers into combinational and pipelined modules under test. The
experimental results prove that the reseeding method works for
accumulator based structures, multipliers, or encryption modules as
efficiently as for the classic linear feedback shift registers, and
some times even better.
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| publisher |
International Test Conference
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| type |
Text
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| Article in Proceedings
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| source |
In: Proceedings of the 31st IEEE International Test Conference
(ITC), Atlantic City, NJ, October 3-5, 2000, pp. 644-651
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| contributor |
Rechnerarchitektur (IFI)
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| subject |
Reliability, Testing, and Fault-Tolerance (CR B.8.1)
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